Browsing by Subject Code > EIE306
Showing results 1 to 15 of 15
| Subject Code | Subject Title | Academic Year | Term | Examination Session |
|---|---|---|---|---|
| EIE306 | IC Technology and Processes | 2005 / 2006 | Second | Examination |
| EIE306 | IC Technology and Processes | 2004 / 2005 | Second | Re-examination |
| EIE306 | IC Technology and Processes | 2004 / 2005 | Second | Examination |
| EIE306 | IC Technology and Processes | 2006 / 2007 | First | Examination |
| EIE306 | IC Technology and Processes | 2007 / 2008 | First | Examination |
| EIE306 | IC Technology and Processes | 2009 / 2010 | First | Examination |
| EIE306 | IC Technology and Processes | 2010 / 2011 | First | Examination |
| EIE306 | IC Technology and Processes | 2008 / 2009 | First | Examination |
| EIE306 | IC Technology and Processes | 2011 / 2012 | First | Examination |
| EIE306 | IC Technology and Processes | 2013 / 2014 | First | Examination |
| EIE306 | IC Technology and Processes | 2013 / 2014 | First | Re-examination |
| EIE306 | IC Technology and Processes | 2012 / 2013 | First | Examination |
| EIE306 | IC Technology and Processes | 2012 / 2013 | First | Examination |
| EIE306; EIE3306 | IC Technology and Processes | 2015 / 2016 | First | Examination |
| EIE306; EIE3306 | IC Technology and Processes | 2014 / 2015 | First | Examination |